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Glass Technology for the next generation X-ray optics: Report on Bonnet test for polishing procedure definition

Date Issued
2018
Author(s)
Abstract
The scope of the document is to report the activities performed in preparation of the Bonnet polishing on board of LT-Ultra lathe. This activity replaces the chemical etching tests, initially foreseen to study the SSD removal from the raw fused silica material. As the procurement chain for the new shells was not yet fixed, a standard polishing procedure for the SSD removal has been preferred, as the results could be used in more independent way.
Volume
TN4000_03
Uri
Rights
open.access
File(s)
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modello-deroga_ASI_TN4000_signed.pdf

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189.64 KB

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Adobe PDF

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ASI _TN_4000_3_BonnetTest.pdf

Description
[Administrators only]
Size

7.12 MB

Format

Adobe PDF

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