Geometrical tools for the analysis of x-ray polarimetric signals
Date Issued
2016
Author(s)
Massaro, E.
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Massa, F.
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Abstract
X-ray polarimetric measurements are based on the study of distributions of the directions of scattered photons or photoelectrons and the search of a sinusoidal modulation with a period of π. We present a new simple tool based on a scatter plot of the modulation curve in which the counts in each angular bin are reported after a shifting by 1/4 of the period. The sinusoidal pattern is thus transformed in a circular plot whose radius is equal to the amplitude of the modulation, while for a not polarized radiation the scatter plot is reduced to a random point distribution centred at the mean frequency value. The advantage of this tool is that one can easily evaluate the statistical significance of the polarimetric detection and can obtain useful information on the quality of the measurement.
Coverage
Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
All editors
den Herder, Jan-Willem A.; Takahashi, Tadayuki; Bautz, Marshall
Series
Volume
9905
Start page
99054I
Conferenece
Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
Conferenece place
Edinburgh, UK
Conferenece date
26 June-1 July, 2016
Issn Identifier
0277-786X
Ads BibCode
2016SPIE.9905E..4IM
Rights
open.access
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