The particle background of the X-IFU instrument

In this paper we are going to review the latest estimates for the particle background expected on the X-IFU instrument onboard of the ATHENA mission. The particle background is induced by two different particle populations: the so called "soft protons" and the Cosmic rays. The first component is composed of low energy particles (< 100 s keV) that get funnelled by the mirrors towards the focal plane, losing part of their energy inside the filters and inducing background counts inside the instrument sensitivity band. The latter component is induced by high energy particles (> 100 MeV) that possess enough energy to cross the spacecraft and reach the detector from any direction, depositing a small fraction of their energy inside the instrument. Both these components are estimated using Monte Carlo simulations and the latest results are presented here.

Volume

44

Issue

3

Start page

371

Uri

http://hdl.handle.net/20.500.12386/29969

Url

https://link.springer.com/article/10.1007%2Fs10686-017-9538-1

Issn Identifier

0922-6435

Ads BibCode

2017ExA....44..371L

Rights

open.access

File(s)

Name

1705.04076.pdf

Description

postprint

Size

1.59 MB

Format

Adobe PDF

Checksum (MD5)

b48bbbbebd67c53cd573f97b185e4570

Name

2017 - Exp Astron - Lotti et al.pdf

Description

[Administrators only]

Size

2.01 MB

Format

Adobe PDF

Checksum (MD5)

3051c66193d9c75cb8383b911f765bb2

The particle background of the X-IFU instrument

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