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PRODOTTI RICERCA INAF
4 ALTRI PRODOTTI SCIENTIFICI (Other scientific products)
4.02 Rapporti tecnici pregressi
ESA Silicon Substrate Microroughness Chracterization
ESA Silicon Substrate Microroughness Chracterization
Date Issued
2005
Author(s)
Vernani, D.
•
Mazzoleni, Francesco
•
SPIGA, Daniele
•
PARESCHI, Giovanni
•
Citterio, Oberto
Series
OAB Technical Reports
Volume
01/2005
Uri
http://hdl.handle.net/20.500.12386/2081
Rights
metadata.only