Skip navigation
  • INAF logo
  • Home
  • Communities
    & Collections
  • Research outputs
  • Researchers
  • Organization units
  • Projects
  • Explore by
    • Research outputs
    • Researchers
    • Organization units
    • Projects
  • Login:
    • My DSpace
    • Receive email
      updates
    • Edit Account details
  • Italian
  • English

  1. OA@INAF
  2. PRODOTTI RICERCA INAF
  3. 3 CONTRIBUTI IN ATTI DI CONVEGNO (Proceedings)
  4. 3.01 Contributi in Atti di convegno
Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12386/23528
Title: Testing multilayer-coated polarizing mirrors for the LAMP soft X-ray telescope
Authors: SPIGA, Daniele 
SALMASO, Bianca 
She, Rui
Tayabaly, Kashmira
Wen, Mingwu
Banham, Robert
COSTA, ENRICO
Feng, Hua
Giglia, Angelo
Huang, Quishi
MULERI, FABIO 
PARESCHI, Giovanni 
SOFFITTA, PAOLO 
TAGLIAFERRI, Gianpiero 
Valsecchi, Giuseppe
Wang, Zhanshan
Issue Date: 2015
Volume: Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
Editors: O'Dell, Stephen L.; Pareschi, Giovanni
Series: PROCEEDINGS OF SPIE 
Number: 9603
First Page: 96031B
Abstract: The LAMP (Lightweight Asymmetry and Magnetism Probe) X-ray telescope is a mission concept to measure the polarization of X-ray astronomical sources at 250 eV via imaging mirrors that reflect at incidence angles near the polarization angle, i.e., 45 deg. Hence, it will require the adoption of multilayer coatings with a few nanometers dspacing in order to enhance the reflectivity. The nickel electroforming technology has already been successfully used to fabricate the high angular resolution imaging mirrors of the X-ray telescopes SAX, XMM-Newton, and Swift/XRT. We are investigating this consolidated technology as a possible technique to manufacture focusing mirrors for LAMP. Although the very good reflectivity performances of this kind of mirrors were already demonstrated in grazing incidence, the reflectivity and the scattering properties have not been tested directly at the unusually large angle of 45 deg. Other possible substrates are represented by thin glass foils or silicon wafers. In this paper we present the results of the X-ray reflectivity campaign performed at the BEAR beamline of Elettra - Sincrotrone Trieste on multilayer coatings of various composition (Cr/C, Co/C), deposited with different sputtering parameters on nickel, silicon, and glass substrates, using polarized X-rays in the spectral range 240 - 290 eV.
Conference Name: SPIE Optical Engineering + Applications, 2015
Conference Place: San Diego, CA, USA
Conference Date: 9-13 August, 2015
URI: http://hdl.handle.net/20.500.12386/23528
URL: http://arxiv.org/abs/1609.09683v1
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9603/1/Testing-multilayer-coated-polarizing-mirrors-for-the-LAMP-soft-X/10.1117/12.2185432.short
ISSN: 0277-786X
ISBN: 9781628417692
DOI: 10.1117/12.2185432
Bibcode ADS: 2015SPIE.9603E..1BS
Fulltext: open
Appears in Collections:3.01 Contributi in Atti di convegno

Files in This Item:
File Description SizeFormat 
2015_SPIE_LAMP_BEAR_96031B.pdfPDF editoriale1.76 MBAdobe PDFView/Open
Show full item record

Page view(s)

27
checked on Jan 18, 2021

Download(s)

14
checked on Jan 18, 2021

Google ScholarTM

Check

Altmetric


Items in DSpace are published in Open Access, unless otherwise indicated.


Explore by
  • Communities
    & Collections
  • Research outputs
  • Researchers
  • Organization units
  • Projects

Informazioni e guide per autori

https://openaccess-info.inaf.it: tutte le informazioni sull'accesso aperto in INAF

Come si inserisce un prodotto: le guide a OA@INAF

La Policy INAF sull'accesso aperto

Documenti e modelli scaricabili

Feedback
Built with DSpace-CRIS - Extension maintained and optimized by Logo 4SCIENCE