Evaluation of novel approach to deflectometry for high accuracy optics
Date Issued
2016
Author(s)
Abstract
A deflectometrical facility was developed at Italian National Institute for Astrophysics-OAB to characterize free-form optics with shape errors within few microns rms. Deflectometry is an interesting technique because it allows the fast characterization of free-form optics. The capabilities of deflectometry in measuring medium-high frequencies are well known, but the low frequencies error characterization is more challenging. Our facility design foresees an innovative approach based on the acquisition of multiple direct images to enhance the performance on the challenging low frequencies range. This contribution presents the error-budget analysis of the measuring method and a study of the configuration tolerances required to allow the use of deflectometry in the realization of optical components suitable for astronomical projects with a requirement of high accuracy for the optics. As test examples we took into account mirrors for the E-ELT telescope.
Coverage
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
All editors
Navarro, Ramón; Burge, James H.
Series
Volume
9912
Start page
991213
Conferenece
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
Conferenece place
Edinburgh, UK
Conferenece date
26 June-1 July, 2016
Issn Identifier
0277-786X
Ads BibCode
2016SPIE.9912E..13S
Rights
open.access
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2016_991213.pdf
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pdf editoriale
Size
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Format
Adobe PDF
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