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  1. OA@INAF
  2. PRODOTTI RICERCA INAF
  3. 3 CONTRIBUTI IN ATTI DI CONVEGNO (Proceedings)
  4. 3.01 Contributi in Atti di convegno
Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12386/28606
Title: The measurement of the noise-equivalent spectral radiance of SIMBIO-SYS/VIHI spectrometer
Authors: FILACCHIONE, GIANRICO 
CAPACCIONI, FABRIZIO 
ALTIERI, FRANCESCA 
Carli, C.
Tommasi, L.
Ficai Veltroni, I.
Dami, M.
Aroldi, G.
Borrelli, D.
Barbis, A.
Baroni, M.
Pastorini, G.
Mugnuolo, R.
CREMONESE, Gabriele 
Issue Date: 2018
Volume: 5th IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)
Series: IEEE METROLOGY FOR AEROSPACE 
First Page: 252
Abstract: We report about the measurement of the Noise- Equivalent Spectral Radiance (NESR) of the VIHI imaging spectromter aboard ESA's Bepi Colombo mission to Mercury. The knowledge of the NESR allows to determine the capability of an optical detector to measure faint signals. A description of the setup used to determine the NESR during the prelaunch calibration campaign is given. The processing of the data col- lected at various operative temperatures and integration times is described. The sensitivity study of the NESR has been performed at the expected detector's temperatures and integration times with the goal to determine the minimum spectral radiance at which VIHI is sensitive during the different observation phases of the mission. A simulation of the expected Signal-to-Noise Ratio (SNR) of VIHI during the different orbital phases is provided.
Conference Name: 5th IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)
Conference Place: Roma
Conference Date: 20-22 June, 2018
URI: http://hdl.handle.net/20.500.12386/28606
URL: https://ieeexplore.ieee.org/document/8453616
ISSN: 2575-7482
ISBN: 978-1-5386-2474-6
DOI: 10.1109/MetroAeroSpace.2018.8453616
Bibcode ADS: 2018maes.conf..252F
Fulltext: open
Appears in Collections:3.01 Contributi in Atti di convegno

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File Description SizeFormat 
Filacchione VIHI NESR IEEE Metrology 2018.pdfpostprint12.46 MBAdobe PDFView/Open
Filacchione_IEEE_metrology_2018.pdf[Administrators only]850.05 kBAdobe PDF
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