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  1. OA@INAF
  2. PRODOTTI RICERCA INAF
  3. 1 CONTRIBUTI IN RIVISTE (Journal articles)
  4. 1.01 Articoli in rivista
Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.12386/29006
Title: The Future of Exoplanet Direct Detection
Authors: Monnier, John
Rau, Gioia
Baines, Ellyn K.
Sanchez-Bermudez, Joel
Elvis, Martin
Ragland, Sam
Akeson, Rachel
van Belle, Gerard
Norris, Ryan
Gordon, Kathryn
Defrère, Denis
Ridgway, Stephen
Le Bouquin, Jean-Baptiste
Anugu, Narsireddy
Scott, Nicholas
Kane, Stephen
Richardson, Noel
Regaly, Zsolt
Zhu, Zhaohuan
Chiavassa, Andrea
Vasisht, Gautam
Stassun, Keivan G.
Dong, Chuanfei
Absil, Olivier
Lacour, Sylvestre
Weigelt, Gerd
Gies, Douglas
Adams, Fred C.
Calvet, Nuria
Quanz, Sascha P.
Espaillat, Catherine
Gardner, Tyler
Greenbaum, Alexandra
Millan-Gabet, Rafael
Packham, Chris
GAI, Mario 
Kral, Quentin
Berger, Jean-Philippe
Linz, Hendrik
Klarmann, Lucia
Bae, Jaehan
Lopez Garcia, Rebeca
Alexandre, Gallenne
Baron, Fabien
Hartmann, Lee
Kishimoto, Makoto
McClure, Melissa
Olofsson, Johan
Haniff, Chris
Line, Michael
Petrov, Romain G.
Smith, Michael
Hummel, Christian
ten Brummelaar, Theo
De Furio, Matthew
Rinehart, Stephen
Leisawitz, David
Danchi, William
Huber, Daniel
Wishnow, Edward
Mourard, Denis
Pope, Benjamin
Ireland, Michael
Kraus, Stefan
Setterholm, Benjamin
White, Russel
Issue Date: 2019
Journal: BULLETIN OF THE AMERICAN ASTRONOMICAL SOCIETY 
Number: 51
Issue: 3
First Page: 514
Abstract: Diffraction fundamentally limits our ability to image and characterize exoplanets. Interferometry offers some advantages in exoplanet detection and characterization and we explore in this white paper some of the potential scientific breakthroughs possible.
URI: http://hdl.handle.net/20.500.12386/29006
URL: https://baas.aas.org/pub/2020n3i514/release/1
ISSN: 2330-9458
Bibcode ADS: 2019BAAS...51c.514M
Fulltext: open
Appears in Collections:1.01 Articoli in rivista

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