EM Test Plan (CAM – Evaluation of an In-Situ Molecular Contamination Sensor for Space Use (ITT-ESA))

Date Issued
2015
Author(s)
•
•
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Saggin, Bortolino
•
Scaccabarozzi, Diego
Abstract
This report describes the test plan on the CAM Engineering Model (User Interface Integration, Stability, Functionality, Performance, Thermal, Proximity Electronics, Vibrations) and the used facilities
Volume
TN5110
Uri
Rights
restricted
File(s)
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Name

TN5110.pdf

Description
[Administrators only]
Size

1.26 MB

Format

Adobe PDF

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