EM Manufacture Plan (CAM – Evaluation of an In-Situ Molecular Contamination Sensor for Space Use (ITT-ESA))
Date Issued
2015
Author(s)
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Saggin, Bortolino
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Scaccabarozzi, Diego
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Tortora, Alessandra
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Abstract
The report describes then manufacture plan of the CAM EM's sensor head, proximity electronics, user interface, main electronics
Volume
TN5130
Rights
restricted
File(s)![Thumbnail Image]()
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Name
TN5130.pdf
Description
[Administrators only]
Size
1.13 MB
Format
Adobe PDF
Checksum (MD5)
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