Browsing by Author Mazzoleni, Francesco
Showing results 1 to 6 of 6
Issue Date | Title | Author(s) | Fulltext |
---|---|---|---|
2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
2008 | Mirror shell 295/2 for SIMBOL-X optic Phase A prototype: results of performed tests at MPE-PANTER | SPIGA, Daniele ; Mazzoleni, Francesco; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Tagliaferri, Gianpiero. | none |
2006 | Mirror shell 338 (Jet-X mandrel n.1 sized shell):Achieved tests at Panter facility and INAF/OAB | SPIGA, Daniele ; CANESTRARI, Rodolfo ; Vernani, D.; Freyberg, M.; Bukert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano , et al | none |
2007 | Results of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfA | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Budau, B.; Burkert, W.; Colombo, D.; Destefanis, G.; Freyberg, M., et al | none |
2005 | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | SPIGA, Daniele ; Burkert, W.; Hartner, G.; Budau, B.; Vernani, D.; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco, et al | none |
2007 | X-ray optic 346 manufactured at MSFC and Harvard-CfA: results of tests at PANTER facility and surface characterization | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Burkert, W.; Budau, B.; Freyberg, M.; Gorenstein, P.; Hartner, G., et al | none |
Showing results 1 to 6 of 6
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