O.A. Brera
OrgUnit's Researchers publications
(Pubblicazioni del Gruppo)
Data di pubblicazione
Risultati: 21 - 40 di 151 (Tempo impiegato: 0.01 secondi).
Data pubblicazione | Titolo | Autore/i | Fulltext | |
---|---|---|---|---|
21 | 2017 | Charged particle diverters for X-ray telescopes: the magnetic field of a uniformly-magnetized wedge | SPIGA, Daniele | none |
22 | 2014 | Cleaning of Ruths primary mirror | SALMASO, Bianca ; CRIMI, Giuseppe | none |
23 | 2016 | Cleaning of Ruths primary mirror: 2016 | SALMASO, Bianca ; CRIMI, Giuseppe | none |
24 | 2016 | Coating design for the PLATO telescope optical unit | SPIGA, Daniele ; PAGANO, Isabella ; Munari, M. ; Magrin, D. ; Viotto, V. ; Ragazzoni, R. | none |
25 | 2007 | Collimator materials absorption power study | MALAGUTI, GIUSEPPE ; FIORETTI, VALENTINA ; FOSCHINI, LUIGI | none |
26 | 2011 | Contratti e Accordi gestiti da UOAS | MALAGUTI, GIUSEPPE ; SANTORO, MARCO ; SCHIAVONE, FILOMENA | none |
27 | 1987 | Description, calibration and laboratory performance of a CCD camera system for astronomical use | Ventura, Giulio; Gandolfi, Enzo; GHIGO, Mauro ; Palumbo, Giorgio; Vigotti, Mario | none |
28 | 2008 | Design of mandrels with internal shaf | BASSO, Stefano | none |
29 | 2017 | Detecting the mitigation of fused silica roughening after Ion Beam Figuring | HOLYSZKO, JOANNA; SALMASO, Bianca ; GHIGO, Mauro ; Arcangeli, L.; Passaretti, F.; SPIGA, Daniele | none |
30 | 2014 | Effective area analytical computation for segmented optics | SPIGA, Daniele | none |
31 | 2006 | Effective Area Calculation for XEUS pore optics | COTRONEO, VINCENZO ; PARESCHI, Giovanni | none |
32 | 2017 | Effective area simulations for the ARCUS SPO MM-0024 | SPIGA, Daniele ; Burwitz, Vadim | none |
33 | 2014 | Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization | Tayabaly, K.; SPIGA, Daniele ; SALMASO, Bianca ; Valsecchi, Giuseppe; Banham, R.; Missaglia, N.; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
34 | 2009 | Engineering Models for SIMBOL-X Phase A: metrological and X-ray analyses post PANTER tests | SPIGA, Daniele ; SIRONI, GIORGIA ; SALMASO, Bianca ; Romaine, S.; Bruni, R.; COTRONEO, VINCENZO ; Mattarello, V.; Garoli, D. | none |
35 | 2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
36 | 2013 | Evaluation of shape deformations induced by the chemical tempering on Gorilla glass samples | CIVITANI, Marta Maria ; SALMASO, Bianca ; PARESCHI, Giovanni | none |
37 | 2013 | Evaluation of shape deformations induced by the coating on flat AF32 samples | CIVITANI, Marta Maria ; SPIGA, Daniele | none |
38 | 2015 | Evaluation of shape deformations induced by the coating on small cylindrical AF32 samples | CIVITANI, Marta Maria ; BASSO, Stefano ; PARESCHI, Giovanni | none |
39 | 2016 | Evaluation of the centroid displacement in the UV diffraction pattern of a Silicon Pore Optic Mirror Module | SPIGA, Daniele ; Valsecchi, Giuseppe; Marioni, F.; Bianucci, G.; Bavdaz, M.; Wille, E. | none |
40 | 2013 | Extending the INAF/OAB Ultraviolet Vertical Optical Bench to a 20 m focal length | SPIGA, Daniele ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Ferrario, I. | none |
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