IASF Palermo
OrgUnit's Researchers publications
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Issue Date | Title | Author(s) | Fulltext | |
---|---|---|---|---|
1 | 2006 | Characterization of a PECVD-SiC replicated mirror sample | CANESTRARI, Rodolfo ; VALTOLINA, RENZO; SPIGA, Daniele ; PARESCHI, Giovanni | none |
2 | 2006 | Mirror shell 338 (Jet-X mandrel n.1 sized shell):Achieved tests at Panter facility and INAF/OAB | SPIGA, Daniele ; CANESTRARI, Rodolfo ; Vernani, D.; Freyberg, M.; Bukert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco | none |
3 | 2007 | Results of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfA | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Budau, B.; Burkert, W.; Colombo, D.; Destefanis, G.; Freyberg, M.; Gorenstein, P.; Gubarev, M.; Hartner, G.; Mazzoleni, Francesco; Ramsey, B.; Romaine, S.; VALTOLINA, RENZO | none |
4 | 2008 | Silicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterization | SPIGA, Daniele ; SIRONI, GIORGIA ; COTRONEO, VINCENZO ; CANESTRARI, Rodolfo ; Destefanis, G. | none |
5 | 2007 | Surface roughness and bulk characterization of SiC and Aluminium samples with PECVD-SiC cladding | CANESTRARI, Rodolfo ; SPIGA, Daniele ; PARESCHI, Giovanni ; Ghigo, Mauri; Arumainathan, S.; Destefanis, G.; Fabbri, P.; Ferrari, C.; Guaita, C.; Nicolosi, P.; Salviati, G. | none |
6 | 2005 | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | SPIGA, Daniele ; Burkert, W.; Hartner, G.; Budau, B.; Vernani, D.; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco; VALTOLINA, RENZO | none |
7 | 2007 | X-ray optic 346 manufactured at MSFC and Harvard-CfA: results of tests at PANTER facility and surface characterization | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Burkert, W.; Budau, B.; Freyberg, M.; Gorenstein, P.; Hartner, G.; Mazzoleni, Francesco | none |
8 | 2009 | X-ray tests at PANTER on Nickel-Cobalt EM#3 (phase A) SIMBOL-X optic prototype | SPIGA, Daniele ; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; Mattarello, V.; Garoli, D.; Boscolo Marchi, E.; BASSO, Stefano ; Valtolina,Renzo; Mattaini,Enrico; CANESTRARI, Rodolfo ; Garegnani, Donato; TAGLIAFERRI, Gianpiero ; PARESCHI, Giovanni ; MORETTI, Alberto | none |
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