SPIGA, Daniele
Date issued
- 24 2020 - 2024
- 129 2010 - 2019
- 24 2000 - 2009
Journal
- 2 astronomy & astrophysics
- 2 experimental astronomy
- 2 journal of synchrotron radiation
- 1 acta astronautica
- 1 applied optics
- 1 journal of applied crystallography
- 1 journal of cosmology and astroparticle physics
- 1 optics express
- 1 pos proceedings of science
- 1 science china. physics, mechanics & astronomy
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Series
Fulltext
- 88 no fulltext
- 28 with fulltext
Results 41-60 of 177 (Search time: 0.019 seconds).
Issue Date | Title | Author(s) | Fulltext | |
---|---|---|---|---|
41 | 2018 | Development of the new long trace profilometer at LCLS for bendable x-ray mirror metrology | Ng, M. L.; Nicolas, J.; SPIGA, Daniele ; Hardin, C. L.; Morton, D. S.; Cocco, D. | open |
2 | 2017 | Direct hot slumping of thin glass foils for future generation x-ray telescopes: current state of the art and future outlooks | SALMASO, Bianca ; BASSO, Stefano ; Brizzolari, C.; CIVITANI, Marta Maria ; GHIGO, Mauro ; PARESCHI, Giovanni ; SPIGA, Daniele ; TAGLIAFERRI, Gianpiero ; VECCHI, Gabriele | open |
3 | 2021 | DVTX-D3_Requirements Specification of the X-Ray Source System | MORETTI, Alberto ; SPIGA, Daniele ; SIRONI, GIORGIA ; BASSO, Stefano ; ZOCCHI Fabio; PARODI Giancarlo | reserved |
4 | 2021 | DVTX-D7_Test_Plan_and_GSE_Definition_Report | SPIGA, Daniele ; De Lorenzi Simone; Tordi Massimiliano; MORETTI, Alberto ; SIRONI, GIORGIA ; BASSO, Stefano | reserved |
5 | 2014 | Effective area analytical computation for segmented optics | SPIGA, Daniele | none |
6 | 2017 | Effective area simulations for the ARCUS SPO MM-0024 | SPIGA, Daniele ; Burwitz, Vadim | none |
7 | 2016 | Electrical connections and driving electronics for piezo-actuated x-ray thin glass optics | LO CICERO, UGO ; SCIORTINO, LUISA; Lullo, Giuseppe; Di Bella, Maurizio; Barbera, Marco ; COLLURA, Alfonso ; CANDIA, Roberto ; SPIGA, Daniele ; BASSO, Stefano ; CIVITANI, Marta Maria ; Pelliciari, Carlo; SALMASO, Bianca | open |
8 | 2014 | Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization | Tayabaly, K.; SPIGA, Daniele ; SALMASO, Bianca ; Valsecchi, Giuseppe; Banham, R.; Missaglia, N.; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
9 | 2009 | Engineering Models for SIMBOL-X Phase A: metrological and X-ray analyses post PANTER tests | SPIGA, Daniele ; SIRONI, GIORGIA ; SALMASO, Bianca ; Romaine, S.; Bruni, R.; COTRONEO, VINCENZO ; Mattarello, V.; Garoli, D. | none |
10 | 2019 | The enhanced X-ray Timing and Polarimetry mission—eXTP | Zhang, ShuangNan; Santangelo, Andrea; FEROCI, MARCO ; Xu, YuPeng; Lu, FangJun; Chen, Yong; Feng, Hua; Zhang, Shu; Brandt, Søren; Hernanz, Margarita; Baldini, Luca; BOZZO , ENRICO ; CAMPANA, RICCARDO ; DE ROSA, ALESSANDRA ; Dong, YongWei; EVANGELISTA, YURI ; Karas, Vladimir; Meidinger, Norbert; Meuris, Aline; Nandra, Kirpal; Pan, Teng; PARESCHI, Giovanni ; Orleanski, Piotr; Huang, QiuShi; Schanne, Stephane; SIRONI, GIORGIA ; SPIGA, Daniele ; Svoboda, Jiri; TAGLIAFERRI, Gianpiero ; Tenzer, Christoph; Vacchi, Andrea; Zane, Silvia; Walton, Dave; Wang, ZhanShan; Winter, Berend; Wu, Xin; in't Zand, Jean J. M.; Ahangarianabhari, Mahdi; Ambrosi, Giovanni; AMBROSINO, Filippo ; Barbera, Marco ; BASSO, Stefano ; Bayer, Jörg; Bellazzini, Ronaldo; BELLUTTI, Pierluigi; Bertucci, Bruna; Bertuccio, Giuseppe; Borghi, Giacomo; Cao, XueLei; Cadoux, Franck; CERAUDO, FRANCESCO ; Chen, TianXiang; Chen, YuPeng; Chevenez, Jerome; CIVITANI, Marta Maria ; Cui, Wei; Cui, WeiWei; Dauser, Thomas; DEL MONTE, Ettore ; DI COSIMO, SERGIO ; Diebold, Sebastian; Doroshenko, Victor; Dovciak, Michal; Du, YuanYuan; Ducci, Lorenzo; Fan, QingMei; Favre, Yannick; FUSCHINO, FABIO ; Gálvez, José Luis; Gao, Min; Ge, MingYu; Gevin, Olivier; Grassi, Marco; Gu, QuanYing; Gu, YuDong; Han, DaWei; Hong, Bin; Hu, Wei; Ji, Long; Jia, ShuMei; Jiang, WeiChun; Kennedy, Thomas; Kreykenbohm, Ingo; Kuvvetli, Irfan; LABANTI, CLAUDIO ; Latronico, Luca; Li, Gang; Li, MaoShun; Li, Xian; Li, Wei; Li, ZhengWei; Limousin, Olivier; Liu, HongWei; Liu, XiaoJing; Lu, Bo; Luo, Tao; Macera, Daniele; Malcovati, Piero; Martindale, Adrian; Michalska, Malgorzata; Meng, Bin; Minuti, Massimo; MORBIDINI, Alfredo ; MULERI, FABIO ; Paltani, Stephane; Perinati, Emanuele; Picciotto, Antonino; Piemonte, Claudio; Qu, JinLu; Rachevski, Alexandre; Rashevskaya, Irina; Rodriguez, Jerome; Schanz, Thomas; Shen, ZhengXiang; Sheng, LiZhi; Song, JiangBo; Song, LiMing; Sgro, Carmelo; Sun, Liang; Tan, Ying; Uttley, Phil; Wang, Bo; Wang, DianLong; Wang, GuoFeng; Wang, Juan; Wang, LangPing; Wang, YuSa; Watts, Anna L.; Wen, XiangYang; Wilms, Jörn; Xiong, ShaoLin; Yang, JiaWei; YANG, SHENG ; Yang, YanJi; Yu, Nian; Zhang, WenDa; Zampa, Gianluigi; Zampa, Nicola; Zdziarski, Andrzej A.; Zhang, AiMei; Zhang, ChengMo; Zhang, Fan; Zhang, Long; Zhang, Tong; Zhang, Yi; Zhang, XiaoLi; Zhang, ZiLiang; Zhao, BaoSheng; Zheng, ShiJie; Zhou, YuPeng; Zorzi, Nicola; Zwart, J. Frans | open |
11 | 2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
12 | 2013 | Evaluation of shape deformations induced by the coating on flat AF32 samples | CIVITANI, Marta Maria ; SPIGA, Daniele | none |
13 | 2016 | Evaluation of the centroid displacement in the UV diffraction pattern of a Silicon Pore Optic Mirror Module | SPIGA, Daniele ; Valsecchi, Giuseppe; Marioni, F.; Bianucci, G.; Bavdaz, M.; Wille, E. | none |
14 | 2013 | Extending the INAF/OAB Ultraviolet Vertical Optical Bench to a 20 m focal length | SPIGA, Daniele ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Ferrario, I. | none |
15 | 2013 | Fine-tuning of slumped AF32 glasses on a Zerodur K20 mould | SALMASO, Bianca ; SPIGA, Daniele | none |
16 | 2022 | First light of BEaTriX, the new testing facility for the modular X-ray optics of the ATHENA mission | BASSO, Stefano ; SALMASO, Bianca ; SPIGA, Daniele ; GHIGO, Mauro ; VECCHI, Gabriele ; SIRONI, GIORGIA ; COTRONEO, Vincenzo ; Conconi, P.; REDAELLI, Edoardo Maria Alberto ; BIANCO, ANDREA ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Sisana, D.; Pelliciari, C.; FIORINI, MAURO ; INCORVAIA, SALVATORE ; USLENGHI, MICHELA ; PAOLETTI, Lorenzo ; Ferrari, C.; Lolli, R.; Zappettini, A.; Sanchez del Rio, M.; Parodi, G.; Burwitz, V.; Rukdee, S.; Hartner, G.; Müller, T.; Schmidt, Thomas ; Langmeier, A.; Della Monica Ferreira, D.; Massahi, S.; Gellert, N. C.; Christensen, F.; Bavdaz, M.; Ferreira, I.; Collon, M.; Vacanti, G.; Barrière, N. M. | open |
17 | 2014 | From AF32 to Eagle XG: characterization of glasses slumped on Zerodur K20-10 mould | SALMASO, Bianca ; Brizzolari, C.; SPIGA, Daniele | none |
18 | 2022 | A fully-analytical treatment of stray light in silicon pore optics for the ATHENA X-ray telescope | SPIGA, Daniele ; SIRONI, GIORGIA ; Della Monica Ferreira, D.; Bavdaz, M.; Bergbäck Knudsen, E.; Ferreira, I.; Jegers, A. S.; MORETTI, Alberto | open |
19 | 2017 | Fused silica segments: a possible solution for x-ray telescopes with very high angular resolution like Lynx/XRS | SALMASO, Bianca ; BASSO, Stefano ; CIVITANI, Marta Maria ; GHIGO, Mauro ; Hołyszko, Joanna; SPIGA, Daniele ; VECCHI, Gabriele ; PARESCHI, Giovanni | open |
20 | 2017 | Fused Silica thin segments for X-ray telescopes: status of the process at OAB | SALMASO, Bianca ; BASSO, Stefano ; CIVITANI, Marta Maria ; GHIGO, Mauro ; PARIANI, Giorgio ; SPIGA, Daniele ; VECCHI, Gabriele ; Arcangeli, L.; Ritucci, A.; Rossi, Massimiliano; PARESCHI, Giovanni | none |
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