SPIGA, Daniele
Results 21-40 of 88 (Search time: 0.005 seconds).
Issue Date | Title | Author(s) | Fulltext | |
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21 | 2017 | Effective area simulations for the ARCUS SPO MM-0024 | SPIGA, Daniele ; Burwitz, Vadim | none |
22 | 2014 | Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization | Tayabaly, K.; SPIGA, Daniele ; SALMASO, Bianca ; Valsecchi, Giuseppe; Banham, R.; Missaglia, N.; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
23 | 2009 | Engineering Models for SIMBOL-X Phase A: metrological and X-ray analyses post PANTER tests | SPIGA, Daniele ; SIRONI, GIORGIA ; SALMASO, Bianca ; Romaine, S.; Bruni, R.; COTRONEO, VINCENZO ; Mattarello, V.; Garoli, D. | none |
24 | 2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
25 | 2013 | Evaluation of shape deformations induced by the coating on flat AF32 samples | CIVITANI, Marta Maria ; SPIGA, Daniele | none |
26 | 2016 | Evaluation of the centroid displacement in the UV diffraction pattern of a Silicon Pore Optic Mirror Module | SPIGA, Daniele ; Valsecchi, Giuseppe; Marioni, F.; Bianucci, G.; Bavdaz, M.; Wille, E. | none |
27 | 2013 | Extending the INAF/OAB Ultraviolet Vertical Optical Bench to a 20 m focal length | SPIGA, Daniele ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Ferrario, I. | none |
28 | 2013 | Fine-tuning of slumped AF32 glasses on a Zerodur K20 mould | SALMASO, Bianca ; SPIGA, Daniele | none |
29 | 2014 | From AF32 to Eagle XG: characterization of glasses slumped on Zerodur K20-10 mould | SALMASO, Bianca ; Brizzolari, C.; SPIGA, Daniele | none |
30 | 2017 | Fused Silica thin segments for X-ray telescopes: status of the process at OAB | SALMASO, Bianca ; BASSO, Stefano ; CIVITANI, Marta Maria ; GHIGO, Mauro ; PARIANI, Giorgio ; SPIGA, Daniele ; VECCHI, Gabriele ; Arcangeli, L.; Ritucci, A.; Rossi, Massimiliano; PARESCHI, Giovanni | none |
11 | 2007 | Gold-coated mirror shell test at PANTER facility: Proposed Test Plan Definition | SPIGA, Daniele | none |
12 | 2011 | Hard X-ray mirrors for NHXM: reflectivity and roughness characterization of mirror shell samples | SALMASO, Bianca ; Raimondi, L.; Negri, R.; SPIGA, Daniele ; Binda, R.; Orlandi, A.; Valsecchi, Giuseppe | none |
13 | 2011 | High-resolution X-ray scattering measurement of slumped glasses | SPIGA, Daniele ; Raimondi, L.; SALMASO, Bianca ; CIVITANI, Marta Maria ; Pagano, G.; BASSO, Stefano ; GHIGO, Mauro ; PROSERPIO, Laura | none |
14 | 2012 | IXO back-up optics with slumped glasses: Proof of Concept (PoC) tests at PANTER and INAF/OAB | SPIGA, Daniele ; SALMASO, Bianca ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; SIRONI, GIORGIA ; Pagano, G.; Zambra, A.; Burwitz, Vadim | none |
15 | 2012 | IXO back-up optics with slumped glasses: XOU-BB tests at PANTER and INAF/OAB | SPIGA, Daniele ; CIVITANI, Marta Maria ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; SALMASO, Bianca ; PARESCHI, Giovanni ; Zambra, A.; Pagano, G.; Burwitz, Vadim; Menz, B.; Hartner, G.; Budau, B.; Friedrich, P.; Winter, A. | none |
16 | 2013 | IXO backup optics with slumped glasses: PANTER test of the Proof of Concept #2 optic | SPIGA, Daniele ; CIVITANI, Marta Maria ; PROSERPIO, Laura; SALMASO, Bianca ; BASSO, Stefano ; Burwitz, Vadim; Menz, B.; Hartner, G.; Budau, B. | none |
17 | 2013 | IXO glasses cleaning procedure after slumping: removing residuals affecting the high frequency region | SALMASO, Bianca ; BIANCO, ANDREA ; PROSERPIO, Laura; GHIGO, Mauro ; SPIGA, Daniele | none |
18 | 2011 | IXO slumped glasses D5 and D7: analysis of spatial wavelength impact on the Point Spread Function by means of the Fresnel diffraction | Raimondi, L.; SPIGA, Daniele ; SALMASO, Bianca ; CIVITANI, Marta Maria ; Pagano, G.; BASSO, Stefano ; GHIGO, Mauro ; PROSERPIO, Laura | none |
19 | 2015 | LTP and ZYGO comparison of the profile measurements of MK20-20B slumping mould | SALMASO, Bianca ; Brizzolari, C.; PARIANI, Giorgio ; SPIGA, Daniele | none |
20 | 2013 | LTP profiles of AF32 glasses with FEA correction: a method to remove spurious mid-frequency errors | SALMASO, Bianca ; BASSO, Stefano ; SPIGA, Daniele | none |
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