PARESCHI, Giovanni
Risultati: 21 - 40 di 44 (Tempo impiegato: 0.003 secondi).
Data pubblicazione | Titolo | Autore/i | Fulltext | |
---|---|---|---|---|
21 | 2018 | New input for the assessment of the BEaTriX design | SALMASO, Bianca ; SPIGA, Daniele ; BASSO, Stefano ; Pelliciari, Carlo; GIRO, Enrico ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
22 | 2006 | Multilayer-coated mirror shell test at PANTER facility: Preliminary Performances Evaluation and Tst Plan definition | SPIGA, Daniele ; PARESCHI, Giovanni | none |
23 | 2005 | Multilayer Coatings for High-Energy Optics for Astrophysics Coating design, optimisation and trade-off | PARESCHI, Giovanni ; COTRONEO, VINCENZO | none |
24 | 2005 | Multilayer Coatings for High-Energy Optics for Astrophysics Assessment of the scientific requirements for the XEUS mirrors | PARESCHI, Giovanni | none |
25 | 2005 | Multilayer coating for high-energy optics for astrophysics (samples characterisation test plan) | SPIGA, Daniele ; PARESCHI, Giovanni ; Grisoni, G.; Valsecchi, Giuseppe | none |
26 | 2006 | Mirror shell 338 (Jet-X mandrel n.1 sized shell):Achieved tests at Panter facility and INAF/OAB | SPIGA, Daniele ; CANESTRARI, Rodolfo ; Vernani, D.; Freyberg, M.; Bukert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco | none |
27 | 2008 | Mirror shell 295/2 for SIMBOL-X optic Phase A prototype: results of performed tests at MPE-PANTER | SPIGA, Daniele ; Mazzoleni, Francesco; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Tagliaferri, Gianpiero. | none |
28 | 2015 | Mirror module design for BICE X-ray telescopes | SPIGA, Daniele ; BASSO, Stefano ; Citterio, Oberto; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Bianucci, G.; Valsecchi, Giuseppe | none |
29 | 2012 | IXO back-up optics with slumped glasses: XOU-BB tests at PANTER and INAF/OAB | SPIGA, Daniele ; CIVITANI, Marta Maria ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; SALMASO, Bianca ; PARESCHI, Giovanni ; Zambra, A.; Pagano, G.; Burwitz, Vadim; Menz, B.; Hartner, G.; Budau, B.; Friedrich, P.; Winter, A. | none |
30 | 2012 | IXO back-up optics with slumped glasses: Proof of Concept (PoC) tests at PANTER and INAF/OAB | SPIGA, Daniele ; SALMASO, Bianca ; PROSERPIO, Laura; GHIGO, Mauro ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; SIRONI, GIORGIA ; Pagano, G.; Zambra, A.; Burwitz, Vadim | none |
31 | 2006 | Influenza dei gradienti di temperatura su una lastra di vetro | BASSO, Stefano ; PARESCHI, Giovanni | none |
32 | 2017 | Fused Silica thin segments for X-ray telescopes: status of the process at OAB | SALMASO, Bianca ; BASSO, Stefano ; CIVITANI, Marta Maria ; GHIGO, Mauro ; PARIANI, Giorgio ; SPIGA, Daniele ; VECCHI, Gabriele ; Arcangeli, L.; Ritucci, A.; Rossi, Massimiliano; PARESCHI, Giovanni | none |
33 | 2015 | Flat Proof of Concept: manufacturing and characterization | CIVITANI, Marta Maria ; BASSO, Stefano ; PARESCHI, Giovanni ; Tintori, M.; Fumi, P. | none |
34 | 2013 | Extending the INAF/OAB Ultraviolet Vertical Optical Bench to a 20 m focal length | SPIGA, Daniele ; BASSO, Stefano ; CIVITANI, Marta Maria ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero ; Ferrario, I. | none |
35 | 2015 | Evaluation of shape deformations induced by the coating on small cylindrical AF32 samples | CIVITANI, Marta Maria ; BASSO, Stefano ; PARESCHI, Giovanni | none |
36 | 2013 | Evaluation of shape deformations induced by the chemical tempering on Gorilla glass samples | CIVITANI, Marta Maria ; SALMASO, Bianca ; PARESCHI, Giovanni | none |
37 | 2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
38 | 2014 | Electroformed nickel samples for the polarimetric LAMP X-ray telescope: sample roughness characterization | Tayabaly, K.; SPIGA, Daniele ; SALMASO, Bianca ; Valsecchi, Giuseppe; Banham, R.; Missaglia, N.; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
39 | 2006 | Effective Area Calculation for XEUS pore optics | COTRONEO, VINCENZO ; PARESCHI, Giovanni | none |
40 | 2006 | Characterization of an antenna for RFID systems | CANESTRARI, Rodolfo ; PARESCHI, Giovanni | none |
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