PARESCHI, Giovanni
Risultati: 1 - 20 di 21 (Tempo impiegato: 0.009 secondi).
Data pubblicazione | Titolo | Autore/i | Fulltext | |
---|---|---|---|---|
1 | 2008 | Calibration of SIMBOL-X optics at PANTER facility: proposed setup and hardware implementation | SPIGA, Daniele ; BASSO, Stefano ; PARESCHI, Giovanni ; Malaguti, P.; Freyberg, M.; Briel, U. | none |
2 | 2006 | Characterization of a PECVD-SiC replicated mirror sample | CANESTRARI, Rodolfo ; VALTOLINA, RENZO; SPIGA, Daniele ; PARESCHI, Giovanni | none |
3 | 2006 | Characterization of an antenna for RFID systems | CANESTRARI, Rodolfo ; PARESCHI, Giovanni | none |
4 | 2006 | Effective Area Calculation for XEUS pore optics | COTRONEO, VINCENZO ; PARESCHI, Giovanni | none |
5 | 2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
6 | 2006 | Influenza dei gradienti di temperatura su una lastra di vetro | BASSO, Stefano ; PARESCHI, Giovanni | none |
7 | 2008 | Mirror shell 295/2 for SIMBOL-X optic Phase A prototype: results of performed tests at MPE-PANTER | SPIGA, Daniele ; Mazzoleni, Francesco; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Tagliaferri, Gianpiero. | none |
8 | 2006 | Mirror shell 338 (Jet-X mandrel n.1 sized shell):Achieved tests at Panter facility and INAF/OAB | SPIGA, Daniele ; CANESTRARI, Rodolfo ; Vernani, D.; Freyberg, M.; Bukert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco | none |
9 | 2005 | Multilayer coating for high-energy optics for astrophysics (samples characterisation test plan) | SPIGA, Daniele ; PARESCHI, Giovanni ; Grisoni, G.; Valsecchi, Giuseppe | none |
10 | 2005 | Multilayer Coatings for High-Energy Optics for Astrophysics Assessment of the scientific requirements for the XEUS mirrors | PARESCHI, Giovanni | none |
11 | 2005 | Multilayer Coatings for High-Energy Optics for Astrophysics Coating design, optimisation and trade-off | PARESCHI, Giovanni ; COTRONEO, VINCENZO | none |
12 | 2006 | Multilayer-coated mirror shell test at PANTER facility: Preliminary Performances Evaluation and Tst Plan definition | SPIGA, Daniele ; PARESCHI, Giovanni | none |
13 | 2006 | Optic (HXT 150 + 230)test at Panter facility: Preliminary Performances Evaluation and Proposed Test Plan definition | SPIGA, Daniele ; PARESCHI, Giovanni | none |
14 | 2007 | Results of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfA | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Budau, B.; Burkert, W.; Colombo, D.; Destefanis, G.; Freyberg, M.; Gorenstein, P.; Gubarev, M.; Hartner, G.; Mazzoleni, Francesco; Ramsey, B.; Romaine, S.; VALTOLINA, RENZO | none |
15 | 2007 | SIMBOL-X: replica simulation on Alluminum samples with Nickel coating | SIRONI, GIORGIA ; SPIGA, Daniele ; PARESCHI, Giovanni | none |
16 | 2007 | Surface roughness and bulk characterization of SiC and Aluminium samples with PECVD-SiC cladding | CANESTRARI, Rodolfo ; SPIGA, Daniele ; PARESCHI, Giovanni ; Ghigo, Mauri; Arumainathan, S.; Destefanis, G.; Fabbri, P.; Ferrari, C.; Guaita, C.; Nicolosi, P.; Salviati, G. | none |
17 | 2005 | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | SPIGA, Daniele ; Burkert, W.; Hartner, G.; Budau, B.; Vernani, D.; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco; VALTOLINA, RENZO | none |
18 | 2007 | X-ray optic 346 manufactured at MSFC and Harvard-CfA: results of tests at PANTER facility and surface characterization | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Burkert, W.; Budau, B.; Freyberg, M.; Gorenstein, P.; Hartner, G.; Mazzoleni, Francesco | none |
19 | 2009 | X-ray tests at PANTER on Nickel-Cobalt EM#3 (phase A) SIMBOL-X optic prototype | SPIGA, Daniele ; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; Mattarello, V.; Garoli, D.; Boscolo Marchi, E.; BASSO, Stefano ; Valtolina,Renzo; Mattaini,Enrico; CANESTRARI, Rodolfo ; Garegnani, Donato; TAGLIAFERRI, Gianpiero ; PARESCHI, Giovanni ; MORETTI, Alberto | none |
20 | 2008 | X-ray tests at PANTER on the EM#2 SIMBOL-X optic (phase A)X-ray tests at PANTER on the EM#2 SIMBOL-X optic (phase A) | SPIGA, Daniele ; PARESCHI, Giovanni ; TAGLIAFERRI, Gianpiero | none |
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