Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/2081
Title: | ESA Silicon Substrate Microroughness Chracterization | Authors: | Vernani, D. Mazzoleni, Francesco SPIGA, Daniele PARESCHI, Giovanni Citterio, Oberto |
Issue Date: | 2005 | Series: | OAB Technical Reports | Number: | 01/2005 | URI: | http://hdl.handle.net/20.500.12386/2081 | Fulltext: | none |
Appears in Collections: | 4.02 Rapporti tecnici pregressi |
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