O.A. Brera
OrgUnit's Researchers publications
(Workgroup Publication)
Results 1-20 of 24 (Search time: 0.01 seconds).
Issue Date | Title | Author(s) | Fulltext | |
---|---|---|---|---|
1 | 2008 | Calibration of SIMBOL-X optics at PANTER facility: proposed setup and hardware implementation | SPIGA, Daniele ; BASSO, Stefano ; PARESCHI, Giovanni ; Malaguti, P.; Freyberg, M.; Briel, U. | none |
2 | 2009 | Calibration of very long (>10 m) focal length X-ray optics at PANTER facility: a short update | SPIGA, Daniele | none |
3 | 2009 | Calibration of W/Si multilayer samples for SIMBOL-X X-ray telescope Phase A development | SPIGA, Daniele ; PROSERPIO, Laura; CIVITANI, Marta Maria ; Dell’Orto, E.; SIRONI, GIORGIA ; COTRONEO, VINCENZO ; Mattarello, V.; Garoli, D.; Boscolo Marchi, E. | none |
4 | 2006 | Characterization of a PECVD-SiC replicated mirror sample | CANESTRARI, Rodolfo ; VALTOLINA, RENZO; SPIGA, Daniele ; PARESCHI, Giovanni | none |
5 | 2005 | Characterization of a W/Si graded multilayer coated mirror shell (n. 326) preformed by Nickel electroforming (april 2004) | SPIGA, Daniele | none |
6 | 2005 | Characterization of Pt/C and W/Si multilayer-coated mirror shells at the PANTER facility (Sep 2004 - Feb 2005) | SPIGA, Daniele | none |
7 | 2009 | Engineering Models for SIMBOL-X Phase A: metrological and X-ray analyses post PANTER tests | SPIGA, Daniele ; SIRONI, GIORGIA ; SALMASO, Bianca ; Romaine, S.; Bruni, R.; COTRONEO, VINCENZO ; Mattarello, V.; Garoli, D. | none |
8 | 2005 | ESA Silicon Substrate Microroughness Chracterization | Vernani, D.; Mazzoleni, Francesco; SPIGA, Daniele ; PARESCHI, Giovanni ; Citterio, Oberto | none |
9 | 2007 | Gold-coated mirror shell test at PANTER facility: Proposed Test Plan Definition | SPIGA, Daniele | none |
10 | 2008 | Mirror shell 295/2 for SIMBOL-X optic Phase A prototype: results of performed tests at MPE-PANTER | SPIGA, Daniele ; Mazzoleni, Francesco; Freyberg, M.; Burkert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Tagliaferri, Gianpiero. | none |
11 | 2006 | Mirror shell 338 (Jet-X mandrel n.1 sized shell):Achieved tests at Panter facility and INAF/OAB | SPIGA, Daniele ; CANESTRARI, Rodolfo ; Vernani, D.; Freyberg, M.; Bukert, W.; Hartner, G.; Budau, B.; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco | none |
12 | 2005 | Multilayer coating for high-energy optics for astrophysics (samples characterisation test plan) | SPIGA, Daniele ; PARESCHI, Giovanni ; Grisoni, G.; Valsecchi, Giuseppe | none |
13 | 2006 | Multilayer-coated mirror shell test at PANTER facility: Preliminary Performances Evaluation and Tst Plan definition | SPIGA, Daniele ; PARESCHI, Giovanni | none |
14 | 2009 | Notes on the development of a magnetic diverter for the SIMBOL-X X-ray telescope | SPIGA, Daniele ; Mattaini, Enrico; Parodi, G.; Ottolina, M.; Fioretti, V. ; TIENGO, ANDREA | none |
15 | 2006 | Optic (HXT 150 + 230)test at Panter facility: Preliminary Performances Evaluation and Proposed Test Plan definition | SPIGA, Daniele ; PARESCHI, Giovanni | none |
16 | 2007 | Results of tests performed at PANTER and INAF/OAB on the X-ray optic 349 manufactured at MSFC and Harvard-CfA | SPIGA, Daniele ; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; BASSO, Stefano ; Bruni, R.; Budau, B.; Burkert, W.; Colombo, D.; Destefanis, G.; Freyberg, M.; Gorenstein, P.; Gubarev, M.; Hartner, G.; Mazzoleni, Francesco; Ramsey, B.; Romaine, S.; VALTOLINA, RENZO | none |
17 | 2008 | Silicon mirrors for the XEUS X-ray telescope pore optics: microroughness characterization | SPIGA, Daniele ; SIRONI, GIORGIA ; COTRONEO, VINCENZO ; CANESTRARI, Rodolfo ; Destefanis, G. | none |
18 | 2007 | SIMBOL-X: replica simulation on Alluminum samples with Nickel coating | SIRONI, GIORGIA ; SPIGA, Daniele ; PARESCHI, Giovanni | none |
19 | 2007 | Surface roughness and bulk characterization of SiC and Aluminium samples with PECVD-SiC cladding | CANESTRARI, Rodolfo ; SPIGA, Daniele ; PARESCHI, Giovanni ; Ghigo, Mauri; Arumainathan, S.; Destefanis, G.; Fabbri, P.; Ferrari, C.; Guaita, C.; Nicolosi, P.; Salviati, G. | none |
20 | 2005 | X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005 | SPIGA, Daniele ; Burkert, W.; Hartner, G.; Budau, B.; Vernani, D.; CANESTRARI, Rodolfo ; PARESCHI, Giovanni ; Citterio, Oberto; BASSO, Stefano ; Mazzoleni, Francesco; VALTOLINA, RENZO | none |
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